Ion beam analysis

    <?xml version="1.0" encoding="UTF-8" ?>

  1. <rdf:RDF>

    1. <skos:Concept rdf:about="http://vocab.getty.edu/aat/300389883">

      1. <skos:prefLabel xml:lang="en">ion beam analysis</skos:prefLabel>

      2. <skos:altLabel xml:lang="en">analysis, ion beam</skos:altLabel>

      3. <skos:altLabel xml:lang="en">IBA</skos:altLabel>

      4. <skos:broader rdf:resource="http://museovirtualfelixcanada.digibis.com//concepts/85152" />
      5. <skos:note xml:lang="en">Refers to analysis of materials on a microscopic or macroscopic scale using a beam of positively charged light ions. Ion beam analysis (IBA) techniques are often used to study works of art, because of their noninvasive and nondestructive character. These techniques exploit the products of interactions between beams of accelerated charged particles and the target in order to determine its elemental composition.</skos:note>

      6. <skos:notation>300389883</skos:notation>

      7. <skos:inScheme rdf:resource="http://museovirtualfelixcanada.digibis.com//schemas/28" />

      </skos:Concept>

    </rdf:RDF>