Atomic force microscopy

<rdf:RDF>

1. <skos:Concept rdf:about="http://vocab.getty.edu/aat/300380468">

   1. <skos:prefLabel xml:lang="en">atomic force microscopy</skos:prefLabel>

   2. <skos:altLabel xml:lang="en">microscopy, atomic force</skos:altLabel>

   3. <skos:altLabel xml:lang="en">AFM</skos:altLabel>

   4. <skos:broader rdf:resource="http://museovirtualfelixcanada.digibis.com//concepts/85208" />

   5. <skos:note xml:lang="en">A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system.</skos:note>

   6. <skos:notation>300380468</skos:notation>

   7. <skos:inScheme rdf:resource="http://museovirtualfelixcanada.digibis.com//schemas/28" />

   </skos:Concept>

</rdf:RDF>