<skos:prefLabel xml:lang="en">scanning electron microscopy</skos:prefLabel>
<skos:prefLabel xml:lang="nl">rasterelectronenmicroscopie (SEM)</skos:prefLabel>
<skos:prefLabel xml:lang="es">microscopía electrónica de barrido</skos:prefLabel>
<skos:altLabel xml:lang="en">electron microscopy, scanning</skos:altLabel>
<skos:altLabel xml:lang="en">microscopy, scanning electron</skos:altLabel>
<skos:altLabel xml:lang="en">SEM (scanning electron microscopy)</skos:altLabel>
<skos:altLabel xml:lang="es">microscopía electrónica de exp</skos:altLabel>
- <skos:broader rdf:resource="http://museovirtualfelixcanada.digibis.com//concepts/85209" />
<skos:note xml:lang="en">The activity of using a scanning electron microscope, which is designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy.</skos:note>
<skos:note xml:lang="es">Actividad de usar un microscopio electrónico de barrido.</skos:note>
<skos:note xml:lang="nl">Het gebruiken van een scannende elektronenmicroscoop.</skos:note>
<skos:notation>300224957</skos:notation>
- <skos:inScheme rdf:resource="http://museovirtualfelixcanada.digibis.com//schemas/28" />